Product Design & Development

New Machine Vision Algorithms Are Solution for Defect Detection

Monday, October 19, 2009

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The new KEYENCE Trend Edge Stain Detection Tool detects flaws on metal surfaces and cylindrical targets, and reliably detects chips and burrs on solar and semiconductor products.

Edge Stain Detection ToolDetecting surface defects is a common machine vision application, of which many are difficult or impossible to perform using conventional vision systems.

The new KEYENCE Trend Edge Stain Detection Tool detects flaws on metal surfaces and cylindrical targets, and reliably detects chips and burrs on solar and semiconductor products.

Examples of detection on difficult target surfaces, having both straight-line profiles and free-form curves, are discussed in this new report which describes the principles behind the tool’s functionality. Download report.

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